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HYC exhibits DIC EXPO 2024!

2024-08-16

         From July 3rd to 5th, the 2024 DIC EXPO was held at the Shanghai New International Expo Centre. HYC participated in the exhibition with various optical, electrical, and BMS testing equipment, as well as multiple products and solutions in the semiconductor field, attracting many industry visitors to communication.

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Highlights

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Mr. Chen Yanshun, Chairman of the Liquid Crystal Branch of China Optics and Optoelectronics Manufacturers' Association, Mr. Liang Xinqing, Executive Vice Chairman and Secretary-General of the Liquid Crystal Branch of China Optics and Optoelectronics Manufacturers' Association, and Mr. Ouyang Zhongcan, Academician of the Chinese Academy of Sciences, and other guests visited the HYC booth for guidance.


Exhibition Area Features

Optoelectronics Exhibition Area

         The Optoelectronics Exhibition Area dynamically showcased three types of color measurement instruments independently developed by HYC, including the dot-type color analyzer, multi-angle spectrograph, and area array colorimeter, with more than a dozen models available for selection. The optical three-in-one testing platform on the exhibition booth integrates these three types of products, enabling single-point chromaticity and brightness detection, GAMMA adjustment, flicker detection, multi-viewing angle chromatic aberration detection, spectral measurement, screen color uniformity, color difference, and black mura detection. In addition, the exhibition area also exhibited the ICM-31-G testing solution with VR lenses, demonstrating the company's capability in optical parameter detection for AR/VR devices.

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Signal Generator (PG) Exhibition Area

         This exhibition area showcased three types of products: CELL PG, Module PG, and Reliability PG. HYC's image signal generator is capable of providing signals and power supply drives for various types of LCD/OLED panels. It can adjust and output various Timing Sequences, ON/OFF timings, etc., for driving various sizes of liquid crystal modules. Simultaneously, it performs adjustments and tests on frequency, voltage, current parameters, gradation values, etc. It is applied to lighting tests of modules of various sizes, achieving functions such as Gamma adjustment, Flicker adjustment, and Demura.

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BMS Testing Equipment Exhibition Area

        The BMS Testing Equipment Exhibition Area showcased three products: Cell Tester, Battery Tester, and Cycler Tester. These products are respectively applied to cell testing, battery management chip and PACK testing, as well as cycle life, pulse, and multiple charge-discharge tests.

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Semiconductor Exhibition Area

         PXIe is a miniaturized test system designed based on the PCIe bus, primarily targeting the testing of consumer electronics chips such as RF front-end chips (switches, PAs, etc.), MEMS sensors, PMICs, etc. It boasts excellent stability, strong scalability, and flexibility. After eight years of in-depth development, we now possess a vast array of boards, with more than 14 types of boards for power, digital, analog, RF, and other functions in mass production, capable of covering the testing of most consumer electronics chips.

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Silver Award for Display Equipment Innovation

         At the DIC AWARD Award Ceremony Dinner on July 3rd, HYC once again won the "Silver Award for Display Equipment Innovation" in the DIC AWARD 2024 International Display Technology Innovation Awards with its "Composite Equipment for Touch Integrated Circuit Open/Short Circuit and Screen Lighting Inspection". This is the second consecutive year that HYC has received this honor, which is a testament to the company's continuous innovation capabilities in the field of display equipment.

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